An open, beginner-friendly book that follows one silicon wafer from sand, through the fab, test and packaging, until it becomes a chip. It skips heavy physics and focuses on process flow, terminology and know-how from the fab floor, with term boxes and know-how boxes in every chapter. No background in semiconductor physics is needed.
Part 0: Before You Start · 第 0 部 開始之前 · 第 0 部 はじめる前に · 제0부 시작하기 전에
Part 1: Fundamentals · 第 1 部 基礎 · 第 1 部 基礎 · 제1부 기초
Part 2: Process Modules · 第 2 部 製程模組 · 第 2 部 プロセスモジュール · 제2부 공정 모듈
Part 3: Process Integration · 第 3 部 製程整合 · 第 3 部 プロセスインテグレーション · 제3부 공정 통합
Part 4: Quality and Yield · 第 4 部 品質與良率 · 第 4 部 品質と歩留まり · 제4부 품질과 수율
Part 5: Back End — Test and Packaging · 第 5 部 後段:測試與封裝 · 第 5 部 後工程:テストとパッケージング · 제5부 후공정: 테스트와 패키징
Part 6: Beyond the Fab · 第 6 部 走出晶圓廠 · 第 6 部 ファブの外へ · 제6부 팹 밖으로
Appendices · 附錄 · 付録 · 부록
| Path |
Chapters |
| 🚀 Quick overview |
0, 1, 11, 14 |
| 💻 Software and firmware engineers |
0, 2, 11, 13, 14, 22, 23, 24 |
| 🏭 Joining the industry |
The whole book, especially 1, 11, 15–18 and Appendix B |
| 📦 Packaging and test |
0, 11, 19–22 |
The original text is written in Traditional Chinese, and the other languages are translations of it. If this book helps you, please give it a ⭐ star so that more people can find it.
This book is based on public information and general industry knowledge. It contains no confidential information, process parameters or internal procedures of any company, and it is not affiliated with any semiconductor company. Most numbers are orders of magnitude or approximate values; actual values vary by process, product and company.
The text and images are licensed under CC BY-NC-SA 4.0. You may share, adapt and translate them for non-commercial purposes, as long as you give credit and share your work under the same license.